Made by Light Tec and distributed in North America by Westboro Photonics
Unique standalone scattering measurement system
The REFLET optical bench is specially suited for reflective and transmissive scatter
analyses for all types of materials. For the ultimate flexibility, the light illumination
and measurement angles are fully independent and robotically controlled in two dimensions.
In this way users may make a set of in-plane, multi-plane or omni-directional measurements
of reflection or transmission. Measurements can be performed using polarization,
photometric, colorimetric and spectral domains.
The accurate analysis of the shape of the reflected or transmitted scatter pattern
provides insight into roughness, defects such as grooves or scratches, ordered
microstructures, and more. The omni-directional breakdown of the spectral composition
yields information on the type of paint or covering, allowing detection of fluorescence,
OVI inks, or iridescence with angular variation of colors, including thin and filtered
layers. Lastly, the spectrophotometric distribution of the backscattered light can
characterize the chemical composition of the surface area of the object, allowing for
analysis of oxidation, dirt, pollution, and more.
The system is designed in a modular fashion. It can easily be modified to specific
user requirements, measurement with integrated flux or spectral analysis, or used with
white colored lighting. The REFLET optical bench is also easy to use manually for
spot inspection or quick analysis.